Optical Metrology
The often rigorous and demanding requirements of designing and manufacturing custom optical products incur a correspondingly rigorous demand upon both engineering and production testing. Optoelectronix has the resources for accommodating the nonstandard geometries and optical requirements to meet those demands head on.
We provide full photometric and radiometric optical characterization of your custom products and components:
| Radiometric Parameters | Photometric Parameters |
| Irradiance | Illuminance |
| Radiant Intensity | Luminous Intensity |
| Total Radiant Flux | Total Luminous Flux |
| Not Applicable | Chromaticity Coordinates |
| Not Applicable | Color Temperature |
| Not Applicable | Dominant Wavelength |
| Additional Parameters | |
| Luminance | |
| Peak Wavelength | |
| Centroid Wavelength | |
| Full Width at any % Power Point | |
| Polar/Flat Field Radiation Pattern | |
| Absolute Detector Spectral Responsivity | |
Additional Parameters:
All spectral characteristics are assessed with a high resolution scanning spectroradiometer covering the range from 350nm to 1100nm with a multitude of wavelength bandpass and stepping options. Luminance values are acquired with a high sensitivity spot photometer. Our equipment is calibrated via N.I.S.T. traceable standards including high intensity irradiance lamps, optometers and photodiodes.
A wide variety of opto-mechanical tooling augments our flexibility to measure our customers systems and components in a manner consistent with their end use. Near and far field irradiance and spatial uniformity are some examples. In support of our design and analysis efforts we utilize ASAP, OptiCAD, ZEMAX and SolidWorks.